NUGRAHA, X.; TAMBUNAN, E. Analisa Yuridis Potensi Overlapping Antara Merk Tiga Dimensi (Three Dimensional Marks) dengan Desain Industri dalam Hukum Hak Kekayaan Intelektual. JIPRO: Journal of Intellectual Property, [S. l.], v. 3, n. 2, p. 1–15, 2021. DOI: 10.20885/jipro.vol3.iss2.art1. Disponível em: https://journal.uii.ac.id/JIPRO/article/view/13135. Acesso em: 6 dec. 2025.